Neural networks for instrumentation, measurement and related industrial applications
- Responsibility
- edited by Sergey Ablameyko [and others].
- Digital
- data file
- Imprint
- Amsterdam ; Washington, DC : IOS ; Tokyo : Ohmsha, 2003.
- Physical description
- 1 online resource (x, 329 pages) : illustrations
- Series
- NATO science series. Series III, Computer and systems sciences ; v. 185. 1387-6694
Browse related items
Start at call number: